Wafer map defect pattern classification with Multi-Input Neural Network using Convolutioal and Handcrafted Features
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Updated
Feb 23, 2022 - Python
Wafer map defect pattern classification with Multi-Input Neural Network using Convolutioal and Handcrafted Features
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This project is to be able to classify any pose into a class by being able to process the landmarks or keypoints in the image.
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