xrr

Differentiable X-ray reflectivity modeling, neural inference and physics-based refinement for thin films

Cross-Replication Reliability Measure (xRR)

Deep learning extraction of thin-film thickness, roughness and density from X-ray reflectivity

XRR thin-film analysis: CNN initial guess of thickness, roughness and SLD refined with GenX

Data behind Penkov, Peng and Fu: measured Co/C curves, the expert's reference fits, every fit job, the agent session transcripts, and the scripts and figures of the paper.

A laboratory's X-ray reflectivity fitting procedure, written so a language-model agent can follow it. Includes the four versions used in the published study, and what transferred between material systems and what did not.

Simple thickness determination of thin films from XRR (X-ray reflectometry) data based on Fourier Transform.

Analyzing X-ray reflectometry data using the Parratt recursion formalism with Nevot-Croce roughness corrections.